Abstract
X-ray optics made of single-crystal materials are widely used at most of the X-ray sources due to the outstanding properties. The main drawback of such optics—the diffraction losses, also known as glitches of intensity in the energy spectrum of the transmitted/diffracted beam. To be able to handle this negative effect, one needs a reliable way to simulate the glitch spectrum in any configuration. Here, we demonstrate the way of precisely determining the crystallographic orientation and unit cell parameters of optical elements just from a small glitch spectrum with the consequent possibility of simulating glitches for any energy.
Highlights
Single-crystal materials have outstanding properties, such as robustness, good reproducibility, and a small number of defects that lead to low background scattering
X-ray optics made of crystalline materials have one significant drawback—diffraction losses due to undesired Bragg/Laue scattering, usually called the “glitch effect” [2]
One-dimensional CRL, which consists of two sets of compound refractive lenses, machined by Micro Usinage Laser (MUL), Grattentour, (France) [23,24]; 3
Summary
Single-crystal materials have outstanding properties, such as robustness, good reproducibility, and a small number of defects that lead to low background scattering. That is why those materials are favored for X-ray optics production. The effect manifests itself as follows: at some energy of the incident X-rays, the main beam, transmitted through or diffracted from the crystalline optical element, loses a part of its intensity. This happens because the incident beam of the wavelength λ satisfies some undesired Bragg condition: 2d sin θ = n λ,
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