Abstract

Helium atom scattering (HAS) has been used to determine the step-edge orientation on a Rh(311) surface, whose close-packed rows are separated by alternating (100) and (111) microfacets. The measurements were performed on a surface in which the step density was previously increased by sputtering. Intense additional peaks were observed at $\ensuremath{\sim}48\ifmmode^\circ\else\textdegree\fi{}$ and $\ensuremath{\sim}56\ifmmode^\circ\else\textdegree\fi{}$ from the specular beam when the incident He beam was impinging on the (100) or (111) microfacets, respectively. The same behavior was observed at different He energies and angles of incidence, demonstrating that the observed peaks are caused by specular diffraction at uphill step edges. The step height could also be determined from the appearance of additional maxima at higher He energies. These results allow us to determine the in-plane scattering geometry in HAS studies of stepped surfaces in a very simple way.

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