Abstract
Co thin films were epitaxially grown on Mo(110) and investigated by spin-polarized low-energy electron microscopy. We find that the spin asymmetry of the electron reflectivity from the Co film alternates its sign as a function of both the electron energy and the Co film thickness as a result of spin-polarized quantum well states in the Co film. By measuring spin-dependent quantum well states, we are able to resolve the spin-split energy dispersions of the Co film precisely. The determined spin-resolved energy bands are further tested by fitting the quantum well states using the phase accumulation model, and the result shows an excellent agreement between the fitting and the experimental data.
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