Abstract
When the manufacturing process is well monitored, occurrence of nondefects would be a frequent event in sampling inspection. The appropriate probability distribution of the number of defects is a zero-inflated Poisson (ZIP) distribution. In this article, determination of single sampling plans (SSPs) by attributes using unity values is considered, when the number of defects follows a ZIP distribution. The operating characteristic (OC) function of the sampling plan is derived. Plan parameters are obtained for some sets of values of (p1, α, p2, β). Numerical illustrations are given to describe the determination of SSP under ZIP distribution and to study its performance in comparison with Poisson SSP.
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More From: Communications in Statistics - Simulation and Computation
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