Abstract

建立了一种基于化学反应-顶空气相色谱测定气相二氧化硅表面硅羟基含量的新方法。实验取气相二氧化硅放入顶空瓶中于105 ℃烘箱中加热2 h去除水分,将甲苯稀释的格氏试剂注入密闭的顶空瓶中,格氏试剂与气相二氧化硅表面硅羟基快速反应产生甲烷(CH4),甲烷量与气相二氧化硅表面硅羟基含量成正比。经过气相色谱-氢火焰离子化检测器测定甲烷,通过外标法定量,根据化学反应方程式计算出样品中羟基含量。同时对反应溶液用量与反应时间等条件进行优化,确定2.0 mL反应溶液,反应15 min为最优的前处理条件。结果表明,硅羟基含量与气相色谱信号值之间存在良好的线性相关性,相关系数为0.9990,相对标准偏差小于3%,本方法的检出限为0.30 mg/g,定量限为1.00 mg/g,开展了4家实验室对5个不同比表面积的样品测试,数据结果的重复性限(r)小于2.5%,再现性限(R)小于6.5%。该方法结合自动化技术,顶空反应操作简单,样品量和试剂用量少,准确性高,重复性好,优于酸碱滴定法,适用于快速检测气相二氧化硅表面硅羟基的含量,解决了硅羟基利用传统方法难以准确测定的难题。该方法的建立对我国二氧化硅产业硅羟基检测标准的制定和产业技术优化,均具有重要的理论和现实意义。

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