Abstract
Surface properties of semiconductors may be determined by measuring the change in attenuation constant, acoustoelectric voltage, and convolution output of a semiconductor on a lithium niobate acoustic surface wave convolver structure. The change is caused by the application of a dc pulse voltage. Experimental results are presented for both p- and n-type silicon. The method is contactless, sensitive, and requires no sample preparation except polishing of one side. Also it is possible to study the variations of the semiconductor surface states along the direction of propagation of the surface wave by proper modification of this method.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
