Abstract
The platinum/[niobium-doped strontium titanate] junction (Pt/SrTiO3:Nb) was investigated by x-ray photoemission (XPE) spectroscopy. Aluminum Kα and synchrotron radiation (6 keV) were used to obtain XPE spectra with different probing depths. The broadening and shift of the XPE peaks for SrTiO3:Nb, which resulted from the formation of a potential barrier at the interface, were quantitatively analyzed by fitting simulations. The barrier height was calculated to be 0.7–0.8 regardless of the Nb concentration. Furthermore, the XPE profile of the junction was reproduced when the permittivity of SrTiO3 was assumed to depend on the electric field.
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