Abstract
The refractive index (RI) of a sapphire crystal melt was determined at high temperatures (exceeding 2350 K) in the visible spectral range. Data were obtained from the analysis results of the state of polarization of the intrinsic thermal radiation of the melt during the laser-heated pedestal growth process. The derived sapphire melt RI is n = 1.72 ± 0.02 for λ = 550 nm, and the linear part of the dispersion in the range 400–750 nm is characterized by the coefficient dn/dλ = −(1.93 ± 0.01) × 10–4 nm − 1.
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