Abstract
Organic thin films show considerable promise for a number of bioelectronic applications, as they exhibit a wide variety of properties depending on the composition, the electronic structure and the microstructure. In this paper we discuss methods and applications of spectroellipsometry towards obtaining this type of information about thin films. Topics include methods of determining both the thickness and the dielectric properties of thin organic films and methods of determining microstructural information such as void fractions from these data. We conclude by indicating possible directions for future optical characterization work in this field. Examples are given throughout.
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