Abstract
An absolute reflectance spectrometer was designed. The instrument is based on an Apple II microcomputer which automates data acquisition, curve fitting, Kramers-Kronig integration, and data plotting. In this system, both the positions of the sample and the detectors are fixed during measurement. The reference and sample signals are detected by scanning a mirror which is engaged with a precise stepping motor. The computer controls all the peripheral instruments; therefore the need of continuous attention to the gain control, frequency scanning, and mirror adjustment is eliminated. Versatile software allows the collected data to be easily manipulated and analyzed. >
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