Abstract
The nonlinear refractive index of large area monolayer molybdenum disulfide (MoS2) thin film at the 1,550[Formula: see text]nm wavelength band is determined using time-resolved z-scan technique. MoS2 exhibits positive nonlinear phase shift with a large nonlinear refractive index, [Formula: see text] value of [Formula: see text]. The obtained value is similar to the [Formula: see text] value of monolayer MoS2 film measured at 2.0[Formula: see text][Formula: see text]m, and is approximately five and seven orders of magnitude larger than silicon and common bulk dielectrics. The large [Formula: see text] indicates that MoS2 can be used as nonlinear refractive 2D material for photonics applications operating in the 1,550[Formula: see text]nm optical telecommunications wavelength band.
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