Abstract
We report a low cost and high accuracy interferometric technique for detecting nanometer vibrations by using a photorefractive crystal interferometer based on two-wave mixing within a Bi12SiO20 (BSO) crystal. The results of small displacement detection on the sample (1–2 nm) and comparison between the sensitivity of Michelson and photorefractive adaptive interferometers are presented. Furthermore, the effect of an external electric field applied to the photorefractive crystal on the Signal to Noise Ratio (SNR) and on the vibrometer sensitivity is investigated.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
