Abstract
Analysis of submicrogram quantities of a perfluorinated polyether (PFPE) homopolymer on different surfaces has been done by finding empirical, quantitative relationships between the intensities of specific peaks in the high mass fragmentation spectra of time-of-flight secondary ion mass spectrometry (TOF-SIMS) and the composition of the PFPE and the number average molecular weight of the polymer samples. These relationships are explained in terms of a direct proportionality of the appropriate high mass fragment ion yields to these different properties of the PFPE material
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.