Abstract
A method, using the photon scanning tunneling microscope, is proposed to measure the mode cutoff wavelengths of a planar optical waveguide with an arbitrary refractive index profile. From the measured values of the cutoff wavelengths, the characteristic thickness and the maximum refractive index of the guiding film are determined. Measurements, performed on a planar waveguide with a complementary error function profile, are in reasonably good agreement with the theoretical calculations.
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