Abstract
The paper proposes a method for measuring complex permittivity and permeability of small semiconductor samples using two spherical microwave cavities. When a spherical sample is placed at the centre of the cavity the electromagnetic fields can be solved exactly, except for unimportant amplitude coefficients in the whole interior of the resonator. Consequently the complex resonant frequencies of different cavity modes have analytic solutions in terms of electric and magnetic material parameters of the sample. The parameters can then be calculated from the measured resonant frequencies and quality factors of two spherical cavities; further more the accuracy of the results is limited only by the accuracy of the measurements. In addition, the exact solutions give an opportunity to check the validity of the ordinarily used cavity perturbation theories.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.