Abstract
The mass attenuation coefficients for TlGaSe2, GaAs, GaSe, InSe, InSe:Al, InSe:Cd, InSe:Er, InSe:Ho, InSe:Sn, Si single crystals, human teeth, and different filling materials have been determined at different X-ray energies. We utilized X-ray absorption technique and a gravimetric method to determine these coefficients. X-ray spectra were collected using a Si(Li) detector with Camberra DSA-1000 desktop spectrum analyzer. The energy resolution of the spectrometer is 160 eV at 5.9 keV. The measured values were compared with the theoretical values using the WinXCom program. A good agreement was observed between the experimental theoretical values.
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