Determination of low atomic number elements at trace levels in uranium matrix using vacuum chamber total reflection X-ray fluorescence

Abstract

Determinations of low atomic number elements Na, Mg and Al present at trace concentrations in uranium matrix were made by vacuum chamber total reflection X-ray fluorescence spectrometer for the first time. For this purpose, synthetic samples of uranium with known amounts of these low atomic number elements were prepared by mixing different volumes of their solutions with U solution of high purity. The concentrations of these elements in the samples were in the range of 100–300 μg/g with respect to uranium and 10–20 μg/mL in the solutions. Major matrix uranium was separated by solvent extraction with 30% solution of tri-n-butyl phosphate in dodecane. After the solvent extraction, aqueous phase containing trace elements was mixed with Sc internal standard and the samples were analyzed by vacuum chamber total reflection X-ray fluorescence spectrometer having a Cr Kα excitation source. The total reflection X-ray fluorescence results obtained, after blank corrections, indicated an average deviation of 14% from the calculated concentrations of these low atomic number elements on the basis of their preparation. However, the total reflection X-ray fluorescence determined concentration of Mg was exceptionally lower than the calculated concentration in two samples. These studies have shown that vacuum chamber total reflection X-ray fluorescence is a promising technique for the determination of low atomic number elements in uranium matrix after its separation.