Determination of lithium ion diffusion in lithium–manganese-oxide-spinel thin films by secondary-ion mass spectrometry

Abstract

Lithium ion chemical diffusion coefficients in 6LiMn 2O 4 thin sputtered films (∼2 μm) were determined by the depth profiles of 7Li concentration after adopting the potential step in 7LiClO 4/propylene carbonate solution by using secondary-ion mass spectrometry (SIMS). Lithium chemical diffusion coefficient via bulk ( D bulk) and grain boundary diffusion coefficient normalized with width ( dD gb) were determined as 1.23 × 10 −15 m 2 s −1 and 6.55 × 10 −20 m 3 s −1, respectively.