Determination of level widths and fluorescence yields of some atomic sub-shells for Th and U

Abstract

The level widths and fluorescence yields of some atomic sub-shells were determined using L1, L2 and L3 sub-shell fluorescence yields and linewidths of some L X-rays. For this measurement, the L3l, L3α, L3β, L2β, L2γ, L1β, L1γ, Lβ, Lγ, L1x, L2x and L3x X-ray production cross sections in U and Th have been measured using the 59.5 keV incident photon energy. The measurements were performed using Am-241 radioisotopes as photon sources and a Si(Li) detector. The L X-rays are resolved with a new analytical method. The obtained L3l, L3α, L3β, L2β, L2γ, L1β, L1γ, Lβ, Lγ, L1X, L2X, and L3X X-ray production cross sections were compared with the theoretical calculations using the most reliable theoretical values of Li (i = 1, 2, 3) sub-shell photoionisation cross sections, fluorescence yields, X-ray emission rates and Coster–Kronig transition probabilities. The measured Li, Mi and Ni sub-shell fluorescence yields were compared with the semi-empirical and theoretical values. Further, obtained level widths were compared with the other experimental and theoretical values. The results in the present paper are found to be in good agreement with calculated values.