Abstract
The scanning transmission electron microscope (STEM) provides a route for the determination of interface structure and bonding directly from experimental data. Through an annular detector, Z-contrast images reveal atomic column locations without prior knowledge. The incoherent nature of such images allows a direct structure inversion through a maximum entropy analysis. The Z-contrast image also facilitates atomic-resolution spectroscopy by allowing the probe to be positioned with atomic precision. With this combination of atomic-resolution imaging and spectroscopy, structural units for [001] tilt grain boundaries in SrTiO{sub 3} were identified. All units revealed the presence of half-filled columns, an efficient way to overcome the problem of like-ion repulsion in ionic materials. With the 1.3 {angstrom} probe of the 300-kV STEM, an unexpected core structure has been found for Lomer dislocations at a CdTe/ GaAs [001] interface, while 60{degrees} dislocations were directly identified to be of glide type.
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