Determination of Impurities in Graphite Using Proton Induced Gamma Ray Emission, Total Reflection X-ray Fluorescence and Instrumental Neutron Activation Analysis

Abstract

Determination of impurities in graphite is very important for its quality control, as their presence even at trace level can affect the performance of graphite in various applications. Graphite with equivalent boron content (EBC) less than 5 mg kg-1 is considered as nuclear grade. Elements with high neutron absorption cross section (boron and rare earths) contribute significantly to EBC. Non-destructive method is preferred as there is no sample processing and probability of loss of volatile elements while digestion. Proton Induced Gamma Ray Emission (PIGE), Instrumental Neutron Activation Analysis (INAA) were utilized for the non- destructive determination of impurities in both nuclear and commercial grade graphite. Low Z elements like Li, B, F, Na, Al and Si were detected in graphite by PIGE whereas Na, K, Sc, Cr, Mn, Fe, Co, Zn, Rb, Zr, Sb, Cs, La, Ce, Nd, Sm, Eu, Tb, Yb, Hf, Ta, Th were determined using INAA. Few elements like Ca, Ti, V, Ni, Sr and Pb remained undetected by both the non-destructive techniques. These elements were determined by Total Reflection X-ray Fluorescence (TXRF) after digestion of the graphite samples by dry ashing. Combinations of these techniques were utilized to get maximum information regarding the impurities present in graphite.