Abstract
The mass attenuation coefficients (μm), effective atomic cross section (σa), effective atomic number (Zeff) and effective electron density (Neff) of silicate glasses containing different concentrations of Bi2O3, PbO, and BaO (30–70% by weight) were obtained using MCNP-4C code, XCOM and XMuDat programs, in the energy range of 10 keV–10 MeV. The interpolation method was employed to extract Zeff and Neff. The Auto-Zeff software was used to determine the Zeff as well. The MCNP-4C Code, XCOM and XMuDat programs and Auto-Zeff results were in good agreement. It was found that the μm and σa values decrease with photon energy. Also the results indicate that σa and Zeff of glasses improve by increasing their Bi2O3, PbO and BaO contents, while increasing these contents to the same fraction has no significant effect on μm in the energy range of 0.3–5 MeV, where the Compton Effect takes over as dominant process and Neff do not follow certain rule. Above 0.1 MeV, lead oxide silicate glass showed the highest values of Zeff and σa. Wherever possible, the simulated and calculated values were compared with experimental data.
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