Abstract
A transient response technique that is widely used to measure the minority carrier lifetime in inorganic semiconductors is proposed to measure the lifetime of free polarons in a polymer:fullerene bulk heterojunction (BHJ) solar cell. A numerical model that can be used to describe the transient behavior of BHJ devices has been developed. Using the proposed method, the lifetime of free polarons in poly (3-hexylthiophene) and [6, 6]-phenyl C61-butyric acid methyl ester blend film is estimated to be in the range of 300–400 ns.
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