Abstract

Abstract : Extensive analysis was completed of available fracture mechanics and strength data and graphical procedures developed to relate effective crack tip radius to inherent materials properties. Fracture stress and effective crack tip radius are estimated from a log-log plot of K sub IC and corresponding yield strength using transparent overlays supplied with the paper. Examples are employed to illustrate the method. The influence of testing temperature, metallurgical structure, chemistry, and the existence of an effective crack tip radius are discussed. Associated tables are included relating two dimensionless parameters involving toughness, yield strength, crack tip radius, and peak stress at any elasticity containing a degree of yielding consistent with valid toughness data.

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