Abstract
AbstractA method is proposed for the x‐ray fluorescence (XRF) analysis of dopant concentrations in ZnO ceramic materials. The accuracy of the results is good for all the dopants analyzed except Bi2O3. The thermal behavior of this component was followed by thermogravimetry, showing that in an anhydrous Li2B4O7 medium, partial Bi2O3 volatilization occurs at the temperatures needed for glass bead formation (1100–1200 °C). For comparison, inductively coupled plasma atomic emission spectrometry (ICP‐AES) analysis of the materials was carried out following a wet procedure for sample solution preparation. The results were in agreement with those obtained by XRF except for Bi2O3. However, if Bi2O3 volatilization is avoided, the analysis is accurate. Copyright © 2001 John Wiley & Sons, Ltd.
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