Abstract
The Cliff-Lorimer ratio technique for thin film X-ray microanalysis requires knowledge of the k factors which relate the measured X-ray intensities to the composition of the specimen. This paper reports the determination of k factors at 200 kV for an analytical transmission electron microscope (Hitachi H700H with a LINK 860 system) using mineral standards and homogeneous alloys. The experimental data are compared with calculations of theoretical k factors.
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