Abstract
Determination of boron concentration has become a usual application of x-ray spectrometers. Optimization of the system parameters has reduced the minimum detectable concentrations to a level below 0.1%. At the same time, XRFA provides a maximum reproducibility of results even at low boron concentrations. However, the most important factor is the short time that passes from the preparation of the specimen to displaying the measured data. The latter factor explains the increasing success of XRF spectrometry in analyzing the quality of products in the ceramic and glass industries
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