Determination of binding energies in high purity 2H graphite using XPS

Abstract

This study focuses on the detailed characterization of graphite, employing techniques such as X-ray photoelectron spectroscopy (XPS), X-ray diffraction (XRD), and scanning electron microscopy with energy-dispersive spectroscopy (SEM-EDS). Graphite, a crucial material for engineering applications and advanced technologies, was analyzed in its pure state as provided by the manufacturer, without any pretreatment. XPS analysis revealed a spectrum dominated by carbon, with binding energies confirming the expected electronic structure and the presence of surface functional groups, including oxygen, silicon, and phosphorus. Although these impurities were identified, they do not appear to have affected the binding energies of the primary carbon, suggesting that their influence is confined to the surface properties and does not extend to the internal electronic structure of the graphite. XRD corroborated the high structural purity and detected a secondary SiP2O7 phase in minimal quantities. These findings validate the high quality of the graphite and provide critical information for the scientific community, establishing a benchmark for comparisons in future studies and developments of materials. This work underscores the value of combining XPS, XRD, and SEM-EDS for the thorough characterization of carbon-based materials.