Detection of X-ray polarization of Ar Z-pinch plasma

Abstract

An X-ray polarization spectrometer has been developed for diagnostic applications of X-ray line polarization spectroscopy in Ar Z-pinch plasmas. The diagnosis was based on theoretical modeling of X-ray line polarization-dependent spectra that have been measured simultaneously by a pair of convex crystal analyzers. Surfaces of the crystals were orthogonal with each other in order to diffract the X-ray spectra. The spectrometer was equipped with two pieces of X-ray films that work as the spectral detector. The experimental results have confirmed that there are considerable differences in relative intensities for the Ar XVII resonance line w (1s2p 1P 1–1s 2 1S 0), the Ar XVII intercombination line y (1s2p 3P 1–1s 2 1S 0) and the Li-like satellites with directions perpendicular and parallel to the Z-pinch axis. Linear polarization of the resonance line and the intercombination line has been calculated according to intensity of the spectra. A value of +0.25 was obtained for the polarization of w and a value of +0.14 for the polarization of y.