Abstract

A photovoltaic cell defect polarization imaging small target detection method based on improved YOLOv7 is proposed to address the problem of low detection accuracy caused by insufficient feature extraction ability in the process of small target defect detection. Firstly, polarization imaging technology is introduced, using polarization degree images as inputs to enhance the edge contour information of YOLOv7 for detecting small targets; then, the COT self-attention mechanism is added to reconstruct the SPPCSPC module to improve YOLOv7’s ability to capture and fuse small target features in complex backgrounds; next, the normalized Wasserstein distance (NWD) is used to replace the traditional loss function based on intersection over union (IoU) metric, reducing the boundary offset between the prior box and the closest real target box in the prediction process of the object detection model and reducing the sensitivity of the YOLOv7 network to small object position deviations; finally, by constructing a shortwave infrared polarization imaging system to obtain polarization images of photovoltaic cells and detect small targets with scratch defects in photovoltaic cells, the applicability and effectiveness of the proposed method are verified. The results show that the proposed method has good recognition ability for small target defects in photovoltaic cells. By applying the constructed dataset, the detection accuracy reaches 98.08%, the recall rate reaches 95.06% and the mAP reaches 98.83%.

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