Abstract
AbstractWe present a non‐optical shear force method to control the probe–sample distance for scanning near‐field optical microscopy (SNOM). In this system, the detection of shear force is accomplished by attaching a tapered fibre‐optic probe to a piezoelectric bimorph cantilever, which realizes the excitation and the detection simultaneously. The decrease in amplitude of the cantilever is observed when the probe approaches the sample and the shifts in resonance frequency are measured as a function of set‐point. The shear force images can be obtained reliably because the set‐point is >0.8. These results suggest that the system is reasonably sensitive to shear force and can be used easily for SNOM. Copyright © 2001 John Wiley & Sons, Ltd.
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