Abstract
With the increasing density of CMOS VLSI circuits, it is necessary to test for the combinations of different multiple faults. This paper studies the possibility of using single stuck-at fault test set (SSFTS) to detect multiple faults and their combinations. The paper shows that a single stuck-at fault test set can detect single and multiple self-feedback bridging faults, combinations of feedback bridging, input bridging and stuck-on faults when current monitoring is done. We also prove that a single stuck-at fault test set can detect the combination of single stuck-open fault and some other faults like bridging and stuck-on faults when both logic and current monitoring are done.< <ETX xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">></ETX>
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