Abstract
The use of synchrotron radiation diffraction (SRD) in con‐junction with conventional laboratory X‐ray diffraction (XRD) for analyzing the phase assemblage of selected alu‐mina‐based ceramics is described. This paper outlines the benefits of synchrotron powder diffraction in resolving mi‐norand impurity phases in various alumina ceramics. Laboratory XRD is shown to provide only cursory details of minor crystalline phases which are strikingly evident and clearly defined from application of SRD analysis. The po‐tential of SRD techniques to characterize low‐level crystal‐line phases and as a check for “phase purity” in ceramic systems is considered.
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