Abstract
We report on a direct comparison in the detectability of individual sub-pixel-size features between the three complementary contrast channels provided by edge-illumination x-ray phase contrast imaging at constant exposure time and spatial sampling pitch. The dark-field (or ultra-small-angle x-ray scattering) image is known to provide information on sample micro-structure at length scales that are smaller than the system’s spatial resolution, averaged over its length. By using a custom-built groove sample, we show how this can also be exploited to detect individual, isolated features. While these are highlighted in the dark-field image, they remain invisible to the phase and attenuation contrast channels. Finally, we show images of a memory SD card as an indication towards potential applications.
Highlights
Since Wilhelm Röntgen’s discovery of x-rays in 1895, x-ray imaging has been widely used for visualizing the internal structure of a sample non-destructively
We report on a direct comparison in the detectability of individual sub-pixel-size features between the three complementary contrast channels provided by edge-illumination x-ray phase contrast imaging at constant exposure time and spatial sampling pitch
We focused on a sample that was designed to assess the ability of the dark-field image to detect individual sub-pixel features that are invisible to the other contrast channels
Summary
Since Wilhelm Röntgen’s discovery of x-rays in 1895, x-ray imaging has been widely used for visualizing the internal structure of a sample non-destructively. Details on the various approaches can be found in a series of reviews that were recently published [30,31,32] Of these methods, Talbot interferometry and EI have attracted particular attention due to the possibility to implement them with extended sources, which is one of the key requirements in terms of translation from high-end synchrotron facilities to standard laboratories and, commercial systems. A model was developed [42] that expresses the spatial resolution in EI XPCI as the smallest distance between the projected focal spot size and the aperture dimension in the pre-sample mask This model is based on a system’s total spread function, and it argues the ability to resolve objects that are separated by more than the full width at half maximum of this spread function. This has instead to do with the signal intensity generated by a single isolated, and in this case sub-pixelsized, object
Sign-in/Register to view highlights & summary Sign-in/Register to access full text options 
Free) 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
