Abstract
The problems related to the detection of high energy particles in a semiconductor counter are discussed. Experimental results obtained with 160 MeV protons from the Orsay synchrocyclotron are shown. For an estimated beam straggling of 240 keV, the energy resolution measured with a coaxial Ge(Li) counter was 290 keV (≅2×10 −4). A scanning over the sensitive volume of the detector with these protons has shown no uncompensated zones.
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