Abstract

Using a focused laser scanner, the optical technique described in the present paper can be used to detect hairline cracks of the type occurring in solar cells subjected to surface texturing. The technique is capable of detecting cracks of the order of a few microns, which, otherwise, can be observed only under high magnification using an optical microscope. The technique consists of scanning a solar cell with a finely focused laser beam and recording the photoresponse (short circuit current or open circuit voltage) as a function of beam position. The presence of a crack is manifested by a sharp dip in the photoresponse.

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