Detection of fungal infestations of wood by ion mobility spectrometry

Abstract

During their growth on wood many fungi produce characteristic volatile organic compounds as secondary metabolites. These microbial volatile organic compounds (MVOCs) can be used as indicators of fungal growth even when such growth is concealed. In order to investigate the formation of these volatile metabolites on building materials, specimens of pine sapwood on agar media colonized by the dry-rot fungus Serpula lacrymans and a mixture of six moulds were examined. MVOCs from this fungal growth were studied over a period of up to half a year by ion mobility spectrometry (IMS) headspace analysis using a sensitive, portable IMS mini-device. The IMS headspace spectra from the growing fungal specimens obtained during this time span are differed from non-incubated wood specimens and indicate the presence of a mixture of MVOCs. The composition and amount of volatile metabolites of the fungi changed during cultivation. This was confirmed by a principal component analysis (PCA). Identification of different MVOCs in the headspace according to drift time and the mobility of ionized gaseous species in reference to GC-MS investigations were proposed. It was concluded that IMS can be used as a rapid and sensitive on-site method to indicate actively growing fungi concealed within wood.