Detection of an infrared near-field optical signal by attaching an infrared-excitable phosphor to the end of a photocantilever.

Abstract

To improve the signal-to-noise ratio of near-field scanning optical microscopy, we propose attaching an infrared-excitable phosphor (IEP) to a photocantilever. One source of noise is the light scattered from locations on the sample surface other than that of the probe tip. By detecting only the light scattered from the tip, we can obtain a near-field optical signal without noise. We attached an IEP particle to a photocantilever to convert infrared light to visible light and we used 1550-nm infrared illumination, so the light scattered from the sample was only infrared. The silicon photodiode of the photocantilever is 10(6) times less sensitive to infrared light than to visible light. As a result, only the converted visible light from the IEP particle, i.e. the signal containing the near-field optical information from the tip, was detected. We verified that the photocantilever detected the signal in the evanescent light produced by infrared illumination and that the detected signal was the light converted by the IEP. The experimental results show the feasibility of detecting infrared light and not the background light through the use of the IEP.