Abstract
The ability of a benchtop powder X-ray diffractometer with a solid state detector to observe the ambient oxidation of ultrasmall (sub 2.5 nm) Pt particles, previously seen only with synchrotron XRD, is demonstrated. The oxidation is corroborated with STEM imaging and fast Fourier transform analysis.
Full Text 
Sign-in/Register to access full text options
Sign-in/Register to access full text options 
Paper version not known
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
