Abstract
The detection of fully and partially defective sensors in a linear array composed of N sensors is addressed. First, the symmetrical structure of a linear array is proposed. Second, a hybrid technique based on the cultural algorithm with differential evolution is developed. The symmetrical structure has two advantages: (1) Instead of finding all damaged patterns, only (N–1)/2 patterns are needed; (2) We are required to scan the region from 0° to 90° instead of from 0° to 180°. Obviously, the computational complexity can be reduced. Monte Carlo simulations were carried out to validate the performance of the proposed scheme, compared with existing methods in terms of computational time and mean square error.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
More From: Frontiers of Information Technology & Electronic Engineering
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.