Abstract
Langmuir-Blodgett (LB) films of arachidic acid, M.W. = 312.54, have been prepared on Si and on Au backings as samples for fast heavy ion-induced desorption mass spectrometry. The well-ordered structure of such film is expected to be favourable for studies of yields for secondary ions as a function of sample film thickness. The secondary ions were mass analyzed with a time-of-flight technique. It was found that the yield increases up to a thickness of 125–150 Å and then saturates. The yield vs. sample film thickness was studied for different types of primary ion, i.e. the amount of enegy deposited in the sample surface was varied. The shape of the film thickness distributions was found to change and shift slightly towards lower saturation thicknesses with increasing electronic stopping power of the primary ion in the range of stopping powers investigated. The results indicate that the fast ion causes a crater, the depth of which is mainly responsible for the thickness dependence found.
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