Abstract
Click to increase image sizeClick to decrease image sizeKey Words: Quality by designTaguchiConcurrent product designCircuit designOff-line quality control Additional informationNotes on contributorsMenberu LuluAbout the Author. Menberu Lulu is associate professor of industrial and systems engineering at Florida International University, Miami. He received a B.S. in industrial engineering from the Georgia Institute of Technology. He earned a M.S. and Ph.D. in industrial engineering from the University of Alabama (Tuscaloosa) and the University of Alabama in Huntsville, respectively. He has held previous academic appointments at the University of Alabama in Huntsville and at the University of South Florida. His research interests are in quality and reliability engineering, simulation, and manufacturing systems.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
