Abstract
In this paper, we propose an attribute np control chart for monitoring the mean lifetime of the products under accelerated life test. The control chart is designed based on a new sampling procedure namely modified multiple dependent state sampling which is a modified version of multiple dependent state sampling methodology. The optimal parameters to construct the proposed chart are determined so that the in-control average run length is as close as possible to the specified average run length. The performance of the proposed control chart is investigated using a simulated data and compared with the performance of existing control charts.
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