Designing of an attribute control chart based on modified multiple dependent state sampling using accelerated life test under Weibull distribution

Abstract

In this paper, we propose an attribute np control chart for monitoring the mean lifetime of the products under accelerated life test. The control chart is designed based on a new sampling procedure namely modified multiple dependent state sampling which is a modified version of multiple dependent state sampling methodology. The optimal parameters to construct the proposed chart are determined so that the in-control average run length is as close as possible to the specified average run length. The performance of the proposed control chart is investigated using a simulated data and compared with the performance of existing control charts.