Abstract
A compact diode is designed and the parameters are specified for optimization of the diode. A comprehensive study of X-ray emission from compact diode, consisting of a sharp edged cathode and a flat anode of copper energized by a single capacitor charged up to 30 kV is reported. The X-ray yield was measured as a function of the interelectrode spacing by using PIN-diode detectors. The maximum x-ray emission in is found to be 320 mJ and the corresponding average efficiency for the X-ray generation was about 0.05%. The total X-ray yield in 4π geometry was recorded as 850 mJ with an overall efficiency of about 0.136%. The efficiency is expected to be further enhanced with an increase in discharge energy, charging voltage, and a reduction of the parasitic inductance.
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