Abstract
High performance delay-locked loop (DLL) is key to the high data rate chip-to-chip communication, suggesting the output jitter, due to power noise, bang-bang noise, temperature-voltage drift, etc, should be properly controlled. In this paper, high speed DRAM operation can be achieved by a dual loop DLL with various novel techniques; a new counting code with hysteretic bit-transitions can remove the large DAC glitches by preventing the binary bit-transitions in the locking states. A delay buffer, which is insensitive to the power supply fluctuations, is proposed. The voltage-temperature (VT) dependencies of the feedback path and the open clock path are balanced, minimizing the VT shift of the clock. As a result, the high-speed DRAM interface with the maximized setup/hold window can be accomplished.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.