Abstract
The positron re-emission microscope (PRM) [1,2] images positrons that are re-emitted from surface after thermalization and diffusion of positrons implanted into material. By using PRM, it is able to nondestructively observe spatial distribution of vacancy-type defects at atomic levels below the detection limits of electron microscopy. Compared with scanning positron microscopy, PRM potentially has better lateral resolution with faster imaging time by more than one order of magnitude. However, in the previous studies of PRM [1-3], a long imaging time (more than 8 hours) was needed to acquire one image because radioisotope (RI) was used as a positron source. For practical use, a substantial reduction of the imaging time is required.
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