Abstract
A proposal of the design for a deflectometric profilometer that combines several advantages in one device to achieve an ultra-precise straightness measurement as a scanning deflectometer is described. The device allows measurement of the absolute flatness of large optical surfaces at the nanometer level. The proposed setup also allows the ability to measure optical flats with both sides polished. The along-scan resolution of the measured profiles could be below a millimeter.
Published Version
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
