Abstract

The high degree of spatial coherence and extreme pulse energies available at x-ray free electron laser (XFEL) sources naturally support coherent diffractive imaging applications. In order to optimally exploit these unique properties, the optical systems at XFELs must be highly transmissive, focus to appropriate sizes matched to the scale of samples to be investigated and must minimally perturb the wavefront of the XFEL beam. We present the design and simulated performance of two state-of-the-art Kirkpatrik–Baez mirror systems that form the primary foci of the single particles, clusters and biomolecules and serial femtosecond crystallography (SPB/SFX) instrument of the European XFEL. The two systems, presently under construction, will produce 1 μm and 100 nm scale foci across a 3–16 keV photon energy range. Targeted applications include coherent imaging of weakly scattering, often biological, specimens.

Highlights

  • The single particles, clusters, and biomolecules and serial femtosecond crystallography (SPB/SFX) instrument of the European x-ray free electron laser (XFEL) is designed to perform both single particle imaging [1] and serial crystallography [2]

  • This paper describes the optical system of the under-construction SPB/SFX instrument of the European XFEL, and how the questions of transmission, spot size and wavefront quality have been addressed

  • The European XFEL is an XFEL source based on a superconducting linear accelerator

Read more

Summary

Introduction

The single particles, clusters, and biomolecules and serial femtosecond crystallography (SPB/SFX) instrument of the European x-ray free electron laser (XFEL) is designed to perform both single particle imaging (coherent diffractive imaging, or CDI) [1] and serial crystallography [2]. As CDI at XFEL sources is typically a destructive measurement [3, 4], optical systems for such measurements must ideally bring as many x-ray photons in a single XFEL pulse to the sample as possible. This implies a highly transmissive optical system, as well as best matching the spot size on the sample to the sample’s size, so photons are not ‘wasted’ overilluminating the sample. This paper describes the optical system of the under-construction SPB/SFX instrument of the European XFEL, and how the questions of transmission, spot size and wavefront quality have been addressed.

European XFEL
Coherent optics
Overview
Optical coatings
Thermal loads
Wavefront truncation
Figure error and roughness
Findings
Conclusion
Full Text
Paper version not known

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.