Design of Synthetic Quasi-TEM Transmission Line for CMOS Compact Integrated Circuit

Abstract

This paper presents the design guidelines of the synthetic quasi-TEM transmission line (TL) based on standard 0.18 mum one-poly six-metal complementary metal-oxide-semiconductor (CMOS) technology. The synthetic quasi-TEM TL, also called the complementary-conducting-strip transmission line (CCS TL), is composed of five structural parameters to synthesize its guiding characteristics. Twenty-four designs of CCS TL are reported, with the following unique attributes. First, a characteristic impedance range of 8.62-104.0 Omega is yielded. Second, the maximum value of the slow-wave factor is 4.79, representing an increase of 139.5% over the theoretical limit of the quasi-TEM TL. Third, the ratio of the area of the CCS TL to its corresponding quality factor ( factor) can help to estimate the cost of the loss for the circuit miniaturizations. Additionally, the important CMOS manufacturing of metal density is for the first time involved in the reported TL designs. By following the proposed design methodologies, a practical design example of a -band CMOS rat-race hybrid is reported and experimentally examined in detail to reveal the feasibility of the proposed design guidelines to synthesize the CMOS CCS TL. The chip size without contact pads is 420.0 mum 540.0 mum. The measured loss and isolation of the hybrid at 36.3 GHz are 3.84 and 58.0 dB, respectively.