Abstract
In order to solve the low-sensitivity problem of the dielectric constant with the resonant cavity method, a sensor based on a substrate-integrated waveguide structure loaded with a multi-complementary open resonant ring is proposed. With the enhanced resonance characteristics of the sensor, this design realized the measurement of complex dielectric constants in a wide range. The frequency selectivity of the sensor is improved by the high-quality factor of the substrate-integrated waveguide. By loading three complementary resonant rings with different opening directions in the ground plane, a deeper notch and better out-of-band suppression are achieved. The effect of the complex dielectric constant on both resonant frequency and quality factor is discussed by calculating the material under test with a known dielectric constant. Simulation and experimental results show that a resonance frequency offset of 102 MHz for the per unit dielectric constant is achieved. A wide frequency offset is the prerequisite for accurate measurement. The measurement results of four plates match well with the standard values, with a relative error of the real part of the dielectric constant of less than 2% and an error of less than 0.0099 for the imaginary part.
Highlights
The dielectric constant of a substance is an important characteristic parameter that characterizes the electromagnetic properties of a material
Three CSRR loops with different opening directions realize a deeper notch at the resonant frequency point and enhance the out-of-band suppression of the sensor, to achieve a wider frequency offset for the change in dielectric constant
According to the principle of measuring the complex dielectric constant by the resonant cavity method, the material under test (MUT) is placed in a resonant cavity
Summary
The dielectric constant of a substance is an important characteristic parameter that characterizes the electromagnetic properties of a material. The permittivity of the MUT can be obtained by measuring the resonant frequency shift and the Q variation of the cavity [15,16] This method is simple, and it is suitable for measurements of small sizes, with a low dielectric constant value and low-loss material [17,18]. Three CSRR loops with different opening directions realize a deeper notch at the resonant frequency point and enhance the out-of-band suppression of the sensor, to achieve a wider frequency offset for the change in dielectric constant.
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