Abstract

In order to solve the low-sensitivity problem of the dielectric constant with the resonant cavity method, a sensor based on a substrate-integrated waveguide structure loaded with a multi-complementary open resonant ring is proposed. With the enhanced resonance characteristics of the sensor, this design realized the measurement of complex dielectric constants in a wide range. The frequency selectivity of the sensor is improved by the high-quality factor of the substrate-integrated waveguide. By loading three complementary resonant rings with different opening directions in the ground plane, a deeper notch and better out-of-band suppression are achieved. The effect of the complex dielectric constant on both resonant frequency and quality factor is discussed by calculating the material under test with a known dielectric constant. Simulation and experimental results show that a resonance frequency offset of 102 MHz for the per unit dielectric constant is achieved. A wide frequency offset is the prerequisite for accurate measurement. The measurement results of four plates match well with the standard values, with a relative error of the real part of the dielectric constant of less than 2% and an error of less than 0.0099 for the imaginary part.

Highlights

  • The dielectric constant of a substance is an important characteristic parameter that characterizes the electromagnetic properties of a material

  • Three CSRR loops with different opening directions realize a deeper notch at the resonant frequency point and enhance the out-of-band suppression of the sensor, to achieve a wider frequency offset for the change in dielectric constant

  • According to the principle of measuring the complex dielectric constant by the resonant cavity method, the material under test (MUT) is placed in a resonant cavity

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Summary

Introduction

The dielectric constant of a substance is an important characteristic parameter that characterizes the electromagnetic properties of a material. The permittivity of the MUT can be obtained by measuring the resonant frequency shift and the Q variation of the cavity [15,16] This method is simple, and it is suitable for measurements of small sizes, with a low dielectric constant value and low-loss material [17,18]. Three CSRR loops with different opening directions realize a deeper notch at the resonant frequency point and enhance the out-of-band suppression of the sensor, to achieve a wider frequency offset for the change in dielectric constant.

Theoretical Analysis
A Rogers
Extracted circuit parameters forCSRR
Perspective
Frequency
Far-field
13. Linear
Findings
Discussion
Conclusions
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